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Line X Tester Analysis in American Cotton (Gossypium hirsutum L.) Jitesh S. Nakum Theses

By:

Nakum, Jitesh S [Author.]

Material type: Text

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TextPublication details: Navsari Genetic & Plant Breeding Dept., N. M. C. A. 2013

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Holdings
Item type	Current library	Collection	Call number	Copy number	Status	Date due	Barcode
Theses	University Library, Navsari	Reference	631.5233 NAK (Browse shelf(Opens below))	1	Not For Loan		61089

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Previous	631.5233 GEN Genetic Architecture and Environmental Adaptation for Seed Cotton Yield its Contributing Traits and Fibre Quality Components in Cotton (Gossypium Hirsutum L.)	631.5233 JOS Genetic Architecture of Dual Purpose Piqeonpea [Cajanuscajan(L.) Millsp]	631.5233 LOD Genetic Analysis for Morphological and Fibre Quality Traits in American Cotton	631.5233 NAK Line X Tester Analysis in American Cotton (Gossypium hirsutum L.)	631.5233 PAT Genration Mean Analysis for Yield and Yield Components in Cowpea (Vigna Unguiculata (L.) Walp)	631.5233 RAU Genetic Variability, Correlation, Path Analysis and Genetic Divergence in Soybean (Glycine max (L.) Merrill)	631.5233 TRI Genetic Architecture of Yield and Its Component Characters in Black Gram During Rabi (Vigna mungo L. Hepper)	Next

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